Polycrystalline solar wafer has the advantage of lower cost than that of monocrystalline wafer. But generally speaking polycrystalline wafer has lower potential efficiency than that of monocrystalline wafer.
Polycrystalline wafer is a material consisting of multiple small silicon crystals.
1 Material properties
Property | Specification | Inspection Method |
Growth method | directional solidification | XRD |
Crystallinity | polycrystalline | Preferential Etch Techniques（ASTM F47-88） |
Conductivity type | P-type | Napson EC-80TPN P/N |
Dopant | Boron | - |
Oxygen concentration[Oi] | ≦1E+17 at/cm3 | FTIR (ASTM F121-83) |
Carbon concentration[Cs] | ≦1E+18 at/cm3 | FTIR (ASTM F123-91) |
2 Electrical properties
Property | Specification | Inspection Method |
Resistivity | 0.5-2 Ωcm (After anneal) | Wafer inspection system |
MCLT (minority carrier lifetime) | ≧2 μs | Sinton QSSPC |
3 Geometry
Property | Specification | Inspection Method |
Geometry | Square or Rectangle | Wafer inspection system |
Bevel edge shape | Line | Wafer inspection system |
Wafer size (Side length*side length) | 156mm*156mm 157mm*186mm 166mm*166mm | Wafer inspection system |
Angle between adjacent sides | 90±3° | Wafer inspection system |
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